The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 1990
Filed:
Sep. 18, 1989
Stefan Brauer, Soedra Sandby, SE;
Jan Johansson, Stehag, SE;
Jan-Ove Nilsson, Ta, SE;
Sven G Olsson, Villa Fortuna, SE;
Siemens Aktiengesellschaft, Berlin and Munich, DE;
Abstract
A method and apparatus for rapid analysis of a sample medium, particularly a flowing sample medium employ light of a defined wavelength which is guided onto a luminescent layer in contact with the sample medium, the luminescent properties of the layer varying in dependence upon characteristics of the sample medium which are to be analyzed. The luminescent light is monitored by detectors, the detector signals being a measure for the characteristic of interest. For undertaking identification of a particular characteristic with very short follow-up time, even in the presence of a number of other characteristics which influence the luminescent properties, the luminescent intensity is identified for a number of different wavelength regions corresponding in number to the number of characteristics, each characteristic differently influencing the luminescent properties in at least one wavelength region. The signals thus obtained are supplied to a processing device for identifying the value of the characteristic of interest.