The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1990

Filed:

May. 26, 1988
Applicant:
Inventors:

Calvin Y Chow, Portola Valley, CA (US);

Gillian M Humphries, Los Altos, CA (US);

Viola T Kung, Menlo Park, CA (US);

Michael M Lacy, Ben Lomand, CA (US);

Paul Hayter, Los Altos, CA (US);

Assignee:

Molecular Devices Corporation, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356427 ; 356436 ; 356440 ;
Abstract

A multibeam photometric measuring device includes a single light source along with a filter assembly for passing only a desired band of wavelengths and an optical system for suitably focusing light from the light source. Light is transmitted individually to each of a plurality of sites disposed on a multi-well sample plate. Enhancement of color distribution is provided by automatic agitation of the reacting agents within the sample wells before a reading is taken at each of the sampling intervals of a kinetic measurement sequence.


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