The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 1990
Filed:
Mar. 09, 1989
Robert L Thomas, Huntington Woods, MI (US);
Pao-Kuang Kuo, Troy, MI (US);
Lawrence D Favro, Huntington Woods, MI (US);
Wayne State University, Detroit, MI (US);
Abstract
A single beam interferometer (10) comprises an intensity modulated laser beam (16) having a focus area for heating a test area (18) on the surface of a sample (12) producing a thermal bump (20). An unfocused probe laser beam (30) is directed toward the solid at an angle and has a beam area greater than the focus area of the heating beam (16). The sample (12) has a reflective surface for reflecting the probe beam (30). The reflected beam (31) comprises an AC beam portion (32) refracted by the thermal bump (20) and a DC beam portion (34) reflected off the unheated surface of the sample (12). The interference pattern (36) produced by the reflected beam (31) is detected and processed to obtain optical, elastic and thermal parameters of the sample (12).