The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1990

Filed:

May. 02, 1989
Applicant:
Inventor:

Michael G Yost, Suisun, CA (US);

Assignee:

Ion Systems, Inc., Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73866 ; 738655 ; 377 10 ;
Abstract

A test chamber is disclosed that permits standardized measurement of particles in the chamber environment. A device or structure that is suspected of the emitting particles and which is desired to be tested is located within the chamber. The chamber environment is then controlled by the introduction of filtered air thereby permitting both static measurements of particle emissions from the device or structure and flow through measurements of particle emissions from the device or structure.


Find Patent Forward Citations

Loading…