The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 1990
Filed:
Aug. 03, 1989
Yoshihiko Teramoto, Tokyo, JP;
Seiko Instruments, Tokyo, JP;
Abstract
A viscoelastsicity measuring apparatus which includes a pair of sample holders, a sample clamping chuck, a detecting rod, a detecting rod support, a displacement detector, a force generator, a sine-wave generator, an amplifier and a heat source for heating the sample and which operates such that a sine-wave stress is induced in the sample and a strain generated in the sample due to the stress is detected so that the modulus of complex elasticity as a characteristic value of the viscoelasticity of the sample is measured on the basis of the amplitude of the stress and the phase difference between the stress and strain. Further, the sample holders are made resilient so that they can move in a direction normal to the sine-wave stress without loss while the extent of their movement in the direction of the stress is made so small as to be negligible, whereby any deformation of the sample due to a thermal expansion of the sample by heating is eliminated in the direction of the stress and strain detection, thereby improving the viscoelasticity measurement accuracy at a temperature different from the temperature at which the sample is set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile