The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 1990
Filed:
Oct. 11, 1988
Applicant:
Inventors:
Roe E English, Euless, TX (US);
Michael A Kilgore, McKinney, TX (US);
Jerry A Crone, Kaufman, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364184 ; 364185 ; 364550 ; 371 165 ; 371 17 ; 371 291 ;
Abstract
Artificial intelligence diagnostic expert system software is used to interrogate and monitor etcher machine state by directly accessing vital hardware/process sensors. Sensor values and `recipe` variables are analyzed to determine cause of failures and recommend repair strategies, realtime monitoring and analysis of these values allows the expert system to predict failures prior to occurrence and show cause of impending failure.