The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 1990

Filed:

May. 15, 1989
Applicant:
Inventors:

Peter J Morgan, Allen, TX (US);

Robert O Miller, The Colony, TX (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 3241 / ; 357 55 ; 437-8 ;
Abstract

Precisely controlled grooves are formed in a semiconductor wafer as part of a total photolithographic process of producing the circuitry and the V-grooves for precise registration of the circuitry relative the edges of the individual chips of the wafer. The same registration facilitates automated electrical testing of each of the chip circuits on the wafer prior to the controlled disassembly of the array of chips into individual die. The design of the electrical connections on the array before disassociation into individual die also facilitates a mass burn-in of the circuits which burn-in tends to identify and eliminate parts subject to early failure.


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