The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 1990

Filed:

Oct. 05, 1989
Applicant:
Inventors:

Takashi Kobayashi, Osaka, JP;

Eiji Suzuki, Osaka, JP;

Yoshitaka Uchiyama, Toyama, JP;

Assignee:

Starlite Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73-7 ;
Abstract

A pin-on-disk type wear testing device which has a non-contact type displacement gauge that moves integrally with the pin type testpiece sliding against the disk type testpiece, so that the said pin-on-disk type wear testing device of the present invention can accurately measure the displacement of the pin type testpiece with respect to the disk type testpiece without being affected by the waving motion of the disk type testpiece, the thermal expansion of the whole device, and other factors, thus making it possible to accurately measure the amount of wear of the pin type testpiece.


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