The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 1990

Filed:

May. 22, 1989
Applicant:
Inventors:

John E Lillig, Diamond Bar, CA (US);

Michael J Whelan, Anaheim Hills, CA (US);

Thomas V Cheon, Costa Mesa, CA (US);

Patricia A Sisson, Santa Ana, CA (US);

Orlando Flores, Anaheim, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65B / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 681 ; 141130 ; 422 63 ; 422 64 ; 422 67 ; 436 43 ;
Abstract

A system of modular analyzers each adapted for independent operation and each possessing different operational characteristics adapted for particular applications. Such modular analyzers may be joined together with precise indexing means such that a single sample carousel may be accessed by fluid transfer probes from both of the analyzers to thus form a system which operates as a single analyzer of increased capacity and versatility.


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