The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 1990
Filed:
Aug. 19, 1988
Applicant:
Inventors:
Delvin D Eberlein, Altoona, WI (US);
Peter Wehner, Eau Claire, WI (US);
Assignee:
Cray Research, Inc., Minneapolis, MN (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01R / ; B01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 725 ; 3241 / ;
Abstract
Improved performance and reliability is obtained in test sockets for integrated circuits (ICs). Sufficient over-travel is provided to prevent pinching when the IC and its carrier are inserted in the test socket and the lid is latched closed. A power operated piston applies controllable and uniform pressure to force the IC leads onto contact pins in the test socket base. This controllable and uniform pressure prevents gouged IC leads, bent test socket pins, and other damage that prevents proper electrical and mechanical contact between IC leads and contact pins resulting in erroneous indications of faulty IC operation.