The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 1990
Filed:
Nov. 09, 1988
Seiji Hidaka, Tachikawa, JP;
Takashi Ishihara, Tachikawa, JP;
Takehiko Hamaguchi, Hachioji, JP;
Nobuaki Sugiyama, Hino, JP;
Kosuke Toura, Hachioji, JP;
Konica Corporation, Tokyo, JP;
Abstract
A method of producing an analytical curve for an analyzing apparatus which provides an analysis result on the basis of the analytical curve in response to a measurement value obtained by photoelectrically measuring light intensity reflected from a slide to be analyzed. A plurality of reference slides are measured by first analyzing apparatus which has a predetermined analytical curve, thereby obtaining a plurality of first measurement values and providing a plurality of first analysis results. The plurality of reference slides are further measured by second analyzing apparatus, thereby obtaining a plurality of second measurement values. Analytical curve for the second analyzing apparatus for produced on the basis of a relation between the first measurement values and the second measurement values so that a plurality of second analysis results correspond to the plurality of first analysis results.