The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 1990

Filed:

Dec. 07, 1988
Applicant:
Inventors:

Seiki Yamada, Ibaraki, JP;

Takashi Kawamura, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250560 ; 356376 ;
Abstract

A method and an apparatus for measuring a shape wherein an article having a cross sectional shape to be measured is subjected to scanning along a direction of a width of the article by means of a pair of displacement sensors, wherein the article is moved in a constant direction and the displacement sensors are located substantially opposing to each other with the article being therebetween, and displacements of a surface on one side and of a surface on another side of the article are detected at every constant pitch, then the cross sectional shape is obtained by processing the detected displacements. The method and the apparatus enable to carry out accurate on-line measurement of a cross sectional shape of an article and provide improved quality control.


Find Patent Forward Citations

Yamada, Seiki. (1990). Method for measuring shape and apparatus therefor (U.S. Patent No. 4959553). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4959553

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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