The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 1990
Filed:
Aug. 03, 1988
Masakazu Tokita, Fuji, JP;
Izumi Kasahara, Numazu, JP;
Toshiba Machine Company, Ltd., Tokyo, JP;
Abstract
In a method of checking pattern, a pattern of a target is photographed and an image of the check pattern is converted into a check image data which is represented by pixel data and density data. A design data for forming the pattern of the target is also converted into a reference image data corresponding to the check image data. The check and reference image data is processed and converted into check and reference gradient vector data, respectively. The check gradient vector data is compared with the reference gradient vector data in a respective corresponding pheripheral pixel data, and its pheripheral pixel data so that the defect is detected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile