The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 1990

Filed:

Apr. 01, 1988
Applicant:
Inventors:

Bret A Herscher, Mt. Vien, CA (US);

Paul R Munro, Sunnyvale, CA (US);

Assignee:

Wavetek Microwave, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
364483 ; 324 / ; 324601 ; 324637 ; 364484 ; 36457101 ; 36457102 ;
Abstract

A swept microwave power measurement system and method capable of performing accurate high performance absolute power measurements on the fly for integration with a scalar analyzer. The system interpolates a calibration factor of the detector at a given frequency point in the sweep between previously established calibration factors at various predetermined frequencies which are stored in memory and then determines an 'apparent' power level of the input signal at a standard frequency. The interpolated calibration factor is applied to the 'apparent' power level to determine the 'absolute' power level at the given frequency point in the sweep.


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