The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 1990

Filed:

Jun. 30, 1989
Applicant:
Inventor:

Frank J Woodberry, Oxnard, CA (US);

Assignee:

Rockwell International Corporation, Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G01J / ;
U.S. Cl.
CPC ...
250339 ; 250226 ; 2505781 ; 350-17 ; 350404 ;
Abstract

A multicolor focal plane array, which detects and distinguishes between incoming electromagnetic radiation within first and second bands of wavelengths, includes a substrate and a two dimensional array of detectors disposed on the substrate and responsive to electromagnetic radiation within a predetermined range of wavelengths including the first and second wavelength bands. A first multilayer thin film filter is disposed on the substrate and interposed between the incoming radiation and a first subset of the detectors in the array, while a second multilayer thin film filter is disposed on the substrate and interposed between the incoming radiation and a second subset of the detectors in the array. The first and second filters include a dielectric/thin metal/dielectric layer combination, the filters differing only in that the thickness of the dielectric layers in the first filter combination are adjusted to select the first wavelength band, while the thicknesses of the dielectric layers in the second filter combination are adjusted to select the second wavelength band. In this manner, the detectors in the first subset are made sensitive to radiation within the first wavelength band, while the detectors in the second subset are sensitive to radiation within the second wavelength band.


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