The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 1990
Filed:
Dec. 15, 1988
Applicant:
Inventor:
David J Edell, Lexington, MA (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128635 ; 128736 ; 204403 ; 204408 ; 374178 ;
Abstract
Flexible measurement probes are described for the determination of oxygen partial pressure; temperature and perfusion; and combined measurement of oxygen partial pressure, temperature, and perfusion. The probes are fabricated by patterning a metal coated substrate to form a conductive pattern of ribbon leads, insulating the conductive ribbon leads except for contact openings, and then attaching sensors to the conductive ribbon leads through noble metal plated open contacts. The plated contacts may be used directly to measure oxygen partial pressure.