The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 1990

Filed:

May. 25, 1988
Applicant:
Inventors:

Toshiki Fujita, Tokyo, JP;

Hirokazu Kimura, Yokohama, JP;

Yoshihiro Yamato, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
73104 ;
Abstract

An apparatus for inspecting glass bottles generally comprises an operation table, an annular conveyor passage onto which glass bottles to be inspected are conveyed one-by-one and on which the bottles are moved slidably, and a turn table coaxially disposed inside the annular conveyor passage. A plurality of guide members are circumferentially mounted on the peripheral surface of the turn table, and a plurality of bottle inspecting stations are disposed circumferentially and spaced equally therearound. The inspecting stations include a down sealing surface measuring station for measuring the down sealing surface of the lip portion of each bottle, an outer diameter and perpendicularly measuring station for measuring outer diameters of the various portions of each bottle and an inner diameter measuring station for measuring the inner diameter of the lip opening. The bottles inspected or measured are conveyed out of the conveying passage and selectively divided into defective bottles and satisfactory bottles.


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