The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 1990
Filed:
Apr. 11, 1989
James N Kniest, Edmonds, WA (US);
Dean D Campbell, Seattle, WA (US);
Ultrasonic Arrays, Inc., Woodinville, WA (US);
Abstract
A method for calibrating a thickness measuring system that automatically compensates for inadvertent movements of the probe. In one emobodiment, a conventional thickness measuring system is provided that incorporates a pair of spaced apart opposing ultrasonic sensors that are positioning a known distance apart. A target is passed between the sensors and the distance from each sensor to the target is measured. The thickness of the target can be determined by subtracting the distance from each sensor to the target from the known distance between the targets. The improvement, being a method of periodically checking the distance between the sensors to compensate for movements of the sensor relative to each other due to such effects as thermal expansion or inadvertent movements. The automatic compensation technique can be applied to a single probe system as well.