The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 1990
Filed:
Feb. 16, 1989
Applicant:
Inventors:
Francois Champonnois, Paris, FR;
Bernard David, Gif/Yvette, FR;
Francis Joffre, Bures sur Yvette, FR;
Assignee:
Commissariat a l'Energie Atomique, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324233 ; 324240 ;
Abstract
A pulsed eddy current testing system for detecting defects in a part. A probe carries an exciting pulse in one coil and receives a measuring signal in a second coil. The measuring signal is sampled at two instants defined by short and long time lags. The two amplitudes obtained are plotted in a representative plane having two reference axes. The point having the signals as coordinates describes a figure eight, when the part has a defect. The size and orientation of the figure gives information on the defect in the part.