The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 1990

Filed:

Jun. 13, 1989
Applicant:
Inventor:

Michel Binet, Tournan, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 3241 / ;
Abstract

A system of automatic control of integrated circuits, in which a wafer of integrated circuits (10) to be tested is supported by a sample carrier (61) and is electrically connected to a probe card (60). This system includes (a) a water-tight chamber (20) traversed by a flow or dry inert gas under excess pressure; (b) a mechanical assembly (40) of platforms (41, 42, 43, 44) for controlling the displacements of the wafer to be tested, with interpolation of a thermally insulated wedge (46) between the assembly of platforms and the sample carrier (61); and (c) a device (80) for cooling the sample carrier (61) internal of the system and including a container (81) of cooling liquid, a tube being prolonged in the cooling liquid to conduct the latter to a cooling cavity (63) internal of the sample carrier, and a device (64, 65) for exhausting the gaseous liquid appearing in the cooling cavity.


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Binet, Michel. (1990). Automatic control system of integrated circuits (U.S. Patent No. 4954774). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4954774

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