The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1990
Filed:
Oct. 24, 1988
Applicant:
Inventor:
Martin Koocher, Lexington, MA (US);
Assignee:
Crystal Diagnostics, Inc., Woburn, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436 36 ; 436 35 ; 436 86 ; 436 20 ; 436 60 ; 436 71 ; 436 73 ; 436 85 ; 436 91 ; 436100 ; 436103 ; 436106 ; 436119 ; 436124 ; 436127 ; 436139 ; 436145 ; 436169 ; 436182 ; 436 79 ; 436 84 ; 436111 ; 436120 ; 436129 ; 436131 ; 436132 ; 436140 ;
Abstract
The present invention provides a general assay methodology suitable for the detection of organic analytes which are neither aldehydes nor ketones and for inorganic substances. The methodology utilizes prepared sensitized films of derivatizing agents and specific developer solutions for the selective and controlled formation of light scattering crystals whose presence serves as a qualitative and/or quantitative measure of the individual analyte of interest in the sample.