The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1990
Filed:
Feb. 26, 1988
Applicant:
Inventors:
Shinya Tanaka, Tokyo, JP;
Koichi Yano, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128648 ; 128652 ;
Abstract
In a non-contact eye pressure meter wherein the cornea of an eye to be examined is pressurized to thereby detect predetermined deformation of the cornea of the eye to be examined and find the eye pressure value, the interim cornea deformation before said predetermined deformation of the cornea of the eye to be examined is detected, whereafter the degree of pressurization to the cornea of the eye to be examined is reduced.