The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1990
Filed:
May. 05, 1989
Alfons Ernst, Traunreut, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A position measuring device for measuring the relative position of two objects (01, 02) comprising a graduation (Ta) in a graduation plane (TFa) of the graduation carrier (TTa) which is connected to one of the objects (01). The object (01) is scanned by a scanning unit (A) which is connected to the other object (02) by means of a carrier (MT). Between the carrier (MT) and the scanning unit (A), a coupling link (K), preferably in the form of a leaf spring, is aligned in the direction of measurement X. This spring has only one rotational degree of freedom in a direction perpendicular to the graduation surface (TFa) of the graduation carrier (TTa). A guide mechanism (F) comprises a guide element (FE) which guides the scanning unit (A) in a direction parallel to the direction of measurement X on a guide surface (FFa) of the graduation carrier (TTa). The guide surface (FFa) is perpendicular to the graduation surface (TFa) of the graduation carrier (TTa). The guide mechanism (F) further comprises a guide joint (FG) for connecting the scanning unit (A) with the guide element (FE). The guide joint (FG) possesses at least one translational degree of freedom perpendicular to the direction of measurement X.