The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1990

Filed:

Sep. 20, 1989
Applicant:
Inventors:

Koji Kaneko, Omiya, JP;

Kazuhisa Seki, Omiya, JP;

Kazutsugu Ogata, Omiya, JP;

Satoshi Mikajiri, Omiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
354400 ; 354410 ; 354421 ;
Abstract

Method and device for measuring the brightness of an object in photographing the object in flash synchronization by use of an AE sensor capable of averaged overall light reading. In the method and device, in accordance with the distance of the object and also with the focal distance of a taking lens, an area occupied by a main object or a ratio of the occupation area on the light receiving surface of the AE sensor is estimated. Then, in accordance with said estimated occupation area or occupation area ratio of the main object and also with a measurement brightness B.sub.V(AV) measured by the AE sensor, there is found a brightness correction value .DELTA.B.sub.V which provides a value that increases as the occupation area of the main object increases and the measurement brightness B.sub.V(AV) measured by the AE sensor increases. Further, the thus obtained brightness correction value .DELTA.B.sub.V is added to the measurement brightness B.sub.V(AV) by the AE sensor to thereby find an object brightness.


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