The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1990

Filed:

Feb. 08, 1988
Applicant:
Inventor:

Heinz Kraus, Traunreut, DE;

Assignee:

Johannes Heidenhain GmbH, Traunreut, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F / ;
U.S. Cl.
CPC ...
430-5 ; 378 35 ; 2505051 ;
Abstract

A radiation mask for the lithographic production of patterns, particularly for the X-ray lithographic or ionic lithographic production of semiconductor modules and semiconductor components and of optical grids. The radiation mask includes a carrier layer mounted in a support frame. The carrier layer has a structure corresponding to the pattern to be created. The carrier layer has in its border portion between the structure and the support frame an elastic portion. This elastic portion serves to ensure dimensional accuracy of the structure when stresses occur. The elastic portion may be formed by perforations defined in the carrier layer circumferentially surrounding the structure.


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Kraus, Heinz. (1990). Radiation mask for the lithographic production of patterns (U.S. Patent No. 4950568). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4950568

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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