The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1990

Filed:

Nov. 30, 1988
Applicant:
Inventors:

Don J Wilen, West Hempstead, NY (US);

Frank Cooper, South Huntington, NY (US);

Assignee:

Computer Instruments Corporation, Hempstead, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 53 ; 73439 ; 73302 ;
Abstract

A microprocessor based instrument is provided for measuring liquid level, specific gravity, or density. The instrument includes a mainframe controller, a remote sensor, and two sets of dip tube assemblies, one for each of two measurement channels. The instrument allows the operator to control both the time at which a bubble is released from one of the dip tubes into a liquid and also the size of the purge bubble which is released. By controlling the timing of bubble release, the pressure within a dip tube can be measured after the system has been allowed to quiet down. If a pair of dip tubes is employed within the same vessel, the differential pressure can be measured when the pneumatic line pressure variations have reached steady state, that is after the gas flow into the dip tubes has been discontinued.


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