The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 1990
Filed:
Apr. 05, 1988
William T Pike, Santa Rosa, CA (US);
Robert T Loder, Jr, Santa Rosa, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A signal measurement system with softkey menus for enabling a user to select a desired test setup, including selection of test measurement for a device. The signal measurement system prompts the user with a set of displayed softkey selections via a user interface to step the user through the setup process. Preferably, a signal processing unit (or analyzer) included in the signal measurement system incorporates the user interface in firmware to aid the user in entering a test sequence for the device to be tested. The analyzer preferably displays the softkey menus on a cathode ray tube included in the analyzer to guide the user. The user is guided through the test sequencing procedure by depressing softkeys. A set of softkey labels (softkey menu) is presented on the display of the analyzer by the firmware for each step in the test sequencing series. As each step of a desired test sequence is entered by the user, the step is displayed on the CRT. Also, the displayed steps are preferably overlaid on data measured in accordance with the test sequence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile