The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 1990
Filed:
Dec. 18, 1987
Hideo Watanabe, Ibaraki, JP;
Komori Printing Machinery, Co., Tokyo, JP;
Abstract
A density measurement position adjustment method includes the steps of setting a reference sheet on which a predetermined pattern is printed on an X-Y coordinate table, designating at least three reference points within the pattern of the reference sheet, determining coordinate positions on the X-Y coordinate table of the three reference points, and memorizing coordinate positions at density measurement reference points within the pattern of the reference sheet with a single point and two intersecting lines obtained by computation based on the coordinate positions of the reference points being as an origin, an X-axis and a Y-axis, respectively. This method further includes the steps of setting a sample sheet on which the same pattern as the pattern on the reference sheet is printed on the X-Y coordinate table, detecting coordinate positions on the X-Y coordinate table of corresponding reference points within the pattern on the sample sheet, determining a detection origin, a detection X-axis and a detection X-axis by computation based on the coordinate positions of the corresponding reference points on the sample sheet, and correcting coordinate positions of density measurment points, which correspond to the density measurement points on the reference sheet, within the pattern on the sample sheet so that the detection origin, detection X-axis and detection Y-axis are in correspondence with the origin, X-axis and Y-axis, respectively.