The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 1990

Filed:

Jun. 29, 1989
Applicant:
Inventor:

Hideto Ozaki, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437 40 ; 437 41 ; 437228 ; 437235 ; 437982 ; 148D / ;
Abstract

A method of manufacturing a semiconductor device, includes the following steps: part of an insulation film is left on the bottom of a contact hole of the insulation film formed on a semiconductor substrate or a separate insulation film is otherwise formed, under which condition a satisfactory slope is formed on the peripheral edge and the side wall of the contact hold by providing the semiconductor substrate with a heat treatment. According to the present invention, it is possible thereafter to improve the step coverage of a metal interconnection to be formed on the surface of the insulation film and to prevent breakage of the metal interconnection, thereby substantially improving the reliability of the resulting semiconductor device.


Find Patent Forward Citations

Ozaki, Hideto. (1990). Method of manufacturing a semiconductor device (U.S. Patent No. 4948743). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4948743

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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