The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 1990
Filed:
May. 13, 1988
Applicant:
Inventors:
Shigeru Sasada, Kyoto, JP;
Yoshihiro Kishida, Kyoto, JP;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
350-66 ; 350-67 ; 350358 ;
Abstract
A light beam deflection scanning method including the steps of: (a) finding data for cancelling distortion of a scanning track to be made on a surface of an object by a light beam focussed on the surface by a scanning lens, the distortion being caused by the lens; (b) directing the light beam at the surface through a scanning lens and deflecting the light beam in a main scanning direction; (c) detecting the position of the light beam on the surface; and the deflecting in step (b), deflecting the light beam in a subscanning direction by an amount based on the data, to thereby cancel the distortion of the scanning track.