The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1990
Filed:
Nov. 30, 1988
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 99 ; 378156 ; 378 82 ;
Abstract
An energy subtraction image measuring system for selectively depicting any target element using X-rays includes an X-ray filter containing the target element. It measures an X-ray image by using a quasi-monoenergetic X-ray beam obtained without using the filter and having a photon energy range that extends above and below the absorption edge of the target element, as well as an X-ray image using an X-ray beam containing only the photon energy component having photon energy levels lower than the absorption edge which is obtained by using the filter. The energy subtraction image measuring system then generates an energy substraction image by the operation of the thus obtained data.