The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1990
Filed:
Jun. 10, 1987
Applicant:
Inventors:
Hideaki Suzuki, Koganei, JP;
Kenji Hosoda, Kawagoe, JP;
Takaharu Kubota, Hino, JP;
Yuji Fukumoto, Hachioji, JP;
Assignee:
Teijin Limited, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
435-7 ; 435 18 ; 435188 ; 436501 ; 436507 ; 436512 ; 436518 ; 436821 ; 530390 ; 530391 ;
Abstract
A standard material for measuring immune complexes which is prepared by chemically binding immunoglobulin and/or its fragment with a complement and/or its derivative through the medium of a bifunctional reagent. By using the standard material, the standard curve which is used for measuring immune complexes existing in the blood is obtained.
Suzuki, Hideaki. (1990). Standard materials for measurement of immune complexes and method for (U.S. Patent No. 4945039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4945039
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