The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 1990

Filed:

Oct. 31, 1989
Applicant:
Inventors:

Edward J Murphy, Des Plaines, IL (US);

Robert E Ansel, Hoffman Estates, IL (US);

John J Krajewski, Wheeling, IL (US);

Assignee:

DeSoto, Inc., Des Plaines, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29B / ; B29C / ;
U.S. Cl.
CPC ...
430394 ; 430269 ; 430322 ; 430945 ; 365120 ; 425174 ; 4251744 ; 427 531 ; 427 541 ; 264-14 ; 264 22 ;
Abstract

An improved stereolithographic process is provided in which the formation of a thin walled three-dimensional object in a reservoir of liquid ultraviolet-curable ethylenically unsaturated material using a support is positioned immediately beneath the upper surface of the liquid reservoir with that upper surface being exposed to ultraviolet light in a pattern to solidify the liquid at and near the upper surface in a series of cross-sections of the desired three-dimensional object, one atop the other. In this way there is formed a series of superposed layers which adhere to one another to build the desired three-dimensional object within the liquid reservoir. The improvement comprises, stopping the exposure at any portion of the surface in the formation of said layers and then repeating the exposure at least once again in the production of each surface layer so that the strength and solvent resistance of the formed object are increased and its distortion is minimized. The ultraviolet exposure of each surface layer is preferably carried out as a series of rapid repeated scans of a computer-directed focused laser.


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