The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1990
Filed:
Sep. 22, 1988
Karl G Nordqvist, Viken, SE;
Tecator AB, Hoganas, SE;
Abstract
A method of reducing the susceptibility to interference of the measured value from a measuring instrument. The measuring instrument is of such a type where a test object is subjected to measurements with respect to a plurality of primary test object properties. Before the actual measurement, the effect has been mapped, by a calibration procedure, which these properties have on the measured value regarding a secondary property of the test object. The calibration procedure is effected on the one hand in that measurements by means of the same or similar instruments are carried out on a sufficient number of test objects each having a known value of the secondary property, and with a sufficient variation of the other test object properties affecting the secondary property, so as to cover expected variations of said properties, and, on the other hand, in that the thus obtained measured values of the primary properties are processed mathematically in such manner that a number of calibration constants in a mathematical relationship between the primary properties and the secondary property are generated. During the calibration procedure, a variation of one or several properties of the measuring instrument, or of representations thereof in the processing of the measured values, is introduced intentionally, said variation having the same order of magnitude as or being substantially greater than expected variations, when one or several test objects are being measured, without such information being supplied to the instrument.