The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1990
Filed:
May. 31, 1989
Walter G Egan, Woodhaven, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
A system for detecting and analyzing polarized radiation having a circular polarization component while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes a radiation filter which comprises a plurality of different wavelength .lambda.1 to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first, second, third and fourth interference filter stripes for each wavelength .lambda.1 to .lambda.n, two parallel polarization filters for each wavelength .lambda.1 to .lambda.n, and two perpendicular polarization filters for each wavelength .lambda.1 to .lambda.n. A complete detection and analysis of the polarization characteristics of the circularly polarized radiation is achieved by applying a quarter wave plate to each polarization component (both parallel and perpendicular) of each wavelength .lambda.n to provide two measurements, one with and one without the quarter wave plate for each measurement (both parallel and perpendicular) at each wavelength .lambda.n.