The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 1990

Filed:

Jun. 26, 1987
Applicant:
Inventors:

Hidetoshi Kanegae, Tokyo, JP;

Minoru Tomikashi, Zushi, JP;

Akira Hino, Yokosuka, JP;

Takashi Ueno, Yokosuka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F02B / ;
U.S. Cl.
CPC ...
36443112 ; 36443104 ; 36443109 ; 36443111 ; 371-91 ;
Abstract

An apparatus for analyzing control data for finding a cause of a trouble produced in a device controlled with a plurality of controlled variables. The apparatus includes sensors sensitive to a condition of the device for producing signals indicative of parameters reflective of the sensed condition. The parameter indicative signals are fed to a control circuit which calculates a valve corresponding to a setting of each of the controlled variables from a desired relationship. The calculated values are stored in time sequence along with the corresponding values of the parameter indicative signals. The stored values are transferred from the first memory to a second memory upon occurrence of a command signal indicating a trouble produced in the device. The transfer values are analyzed to find a cause of the trouble.


Find Patent Forward Citations

Loading…