The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 1990

Filed:

Dec. 20, 1988
Applicant:
Inventor:

Shigeyoshi Osaki, Takarazuka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324636 ; 324635 ; 324641 ;
Abstract

An instrument for measuring the high frequency characteristics of a sheet-like material comprising: a pair of opposed slits formed in a pair of opposed tube walls of a cavity resonator having an optional cross-sectional shape, said slits extending parallel to the tube axis and enabling a sheet-like material to be inserted such that it extends across said cavity resonator; a driving section disposed at one end of said cavity resonator and having a driving conductor for producing microwaves for driving said cavity resonator in the direction to form an electric field which is perpendicular to the tube wall surfaces formed with said pair of slits; a detecting section disposed at the other end of said cavity resonator and having a probe conductor for receiving said microwaves; and a controlling and calculating device for detecting the resonant frequency or attenuation of received microwaves and calculating the high frequency characteristics of the sample from the detection result.


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