The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 1990

Filed:

Aug. 08, 1988
Applicant:
Inventors:

Robert J Deri, Atlantic Highlands, NJ (US);

Elyahou Kapon, Old Bridge Township, Middlesex County, NJ (US);

Assignee:

Bell Communications Research, Inc., Livingston, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02F / ;
U.S. Cl.
CPC ...
350 9614 ; 350 9612 ; 350355 ;
Abstract

A low loss optical waveguide modulator, an essential component of opto-electronic integrated circuits which can combine optical and electronic devices on a single chip optical communication systems is described. The modulator in our embodiment consists of a sequence of epitaxial layers on a single crystal substrate consisting of a n.sup.+ -GaAs substrate, a n.sup.+ -GaAs buffer layer, a n-Al.sub.0.05 Ga.sub.0.95 As electrode layer, an effective i-Al.sub.0.25 Ga.sub.0.75 As confinement layer, an i-GaAs guiding layer, an effective i-Al.sub.0.25 Ga.sub.0.75 As confinement layer, a p-Al.sub.0.25 Ga.sub.0.75 As electrode layer and a p.sup.+ -GaAs cap layer. The layers have an index of refraction profile such that the index of refraction of the confinement layers are substantially less than the index of refraction of the guiding layer and the index of refraction of the first electrode layer is substantially greater than the index of refraction of the first confinement layer.


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