The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 1990
Filed:
Aug. 31, 1988
Jeffrey W Eberhard, Schenectady, NY (US);
Rudolph Koegl, Niskayuna, NY (US);
John P Keaveney, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
The quality of x-ray images is significantly enhanced by adjusting the x-ray system operating parameters in real time during acquisition of x-ray data to take information about the part into account adaptively. X-ray energy, x-ray flux, and integration time can all by varied independently and in combination to improve the signal to noise ratio in the image. The x-ray data from a previous subsection of the image is processed to determine optimum system operating parameters for a next image subsection. x-ray tube voltage is adjusted to change x-ray energy and keep .alpha.L close to 2 over all image subsections. X-ray tube current is adjusted to change x-ray flux and data acquisition integration time is adjusted to keep the signal to noise ratio within limits.