The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 1990

Filed:

May. 22, 1987
Applicant:
Inventors:

Takanori Hisada, Yokohama, JP;

Takesuke Maruyama, Yokohama, JP;

Masaharu Deguchi, Yokohama, JP;

Yoshihiko Noro, Yokohama, JP;

Yoshifumi Honma, Hitachi, JP;

Yoshio Ariki, Yokohama, JP;

Shunichi Taguchi, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350-68 ; 350-65 ;
Abstract

A light scanning system employing a rotating mirror, spherical lens, and a toric-surfaced reflecting mirror. The toric-surfaced reflecting mirror is disposed in the optical path between the spherical lens and the image plane. The spherical lens sufficiently corrects field curvature and the toric-surfaced reflecting mirror corrects scan nonlinearity. And by the spherical lens and the toric-surfaced reflecting mirror together, the field curvature and the scan nonlinearity are satisfactorily corrected. The toric-surfaced reflecting mirror is surfaced to have a circular arc with a larger radius of curvature in the scan plane and to have a circular arc with a smaller radius of curvature in the cross-scan plane.


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