The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 1990

Filed:

Aug. 03, 1989
Applicant:
Inventors:

Sanae Mori, Nagoya, JP;

Takayosi Sasaki, Tajimi, JP;

Takehiro Ozika, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33783 ; 3350104 ; 33797 ;
Abstract

Disclosed is an thickness measuring apparatus comprising: a C-shaped block; a pair of arms which arc provided on the block, each of which is equipped with a pivot section situated at one end thereof, each pivot section being equipped with a spring element; a pair of lever members pivotably mounted on the respective spring elements; measuring elements mounted on the respective outer end sections of the lever members and adapted to be brought into contact with the article to be measured; a first compression spring provided between one of the pair of arms and a section of one of the lever members which is near the inner end thereof so as to bias this lever member; a second compression spring provided between the other of the pair of arms and a section of the other of the lever members which is near the inner end thereof so as to bias this lever member; thickness measuring devices provided respectively on the pair of arms and adapted to detect any movement of the lever members so as to measure the thickness of the article; and a device for driving the inner ends of the lever members such that the outer ends of the lever members are spaced apart from each other.


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