The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 1990
Filed:
Nov. 02, 1988
John W Taylor, Jr, Baltimore, MD (US);
Westinghouse Electric Corp., Pittsburgh, PA (US);
Abstract
A two-parameter clutter map for storing two variables for every spatial location in order to define both the intensity of the interference and the fluctuation characteristics of the interference from scan-to-scan. The two variables are obtained by processing input data from an integrator in two n-pole integrators having different orders. The ratio of the two variables or their difference in logarithmic form is employed as a measure of the scan-to-scan fluctuation characteristics. An option to control alarms and the leading edge of moving rain storms is also provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile