The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 1990

Filed:

Mar. 02, 1988
Applicant:
Inventors:

Seishi Naito, Himeji, JP;

Shuji Tanabe, Himeji, JP;

Toru Nakashima, Himeji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324212 ; 360 31 ;
Abstract

Primary and secondary coils are wound on a differential type magnetic head, and a low frequency signal is applied on the primary coil. Based on the difference between the output voltages from the head when an object of detection is placed near the magnetic head on the detection side and the output voltage therefrom when an object is not placed near the magnetic head, the magnetization characteristic curve of the magnetic flux and the magnetic field is calculated. Since the magnetization characteristic detection is determined by dividing a magnetic flux by the measured area cross section, once the magnetic flux is determined, a general B-H curve can be simply calculated. The magnetization characteristic measurement device includes a differential type magnetic head portion having plural differential type magnetic heads in linear arrangement which is positioned on or near the magnetic thin film of a detection object. The device can calculate magnetization characteristics of the magnetic thin film by applying a low frequency signal on the magnetic head, successively switching differential output voltages given to a cancellation core of the plural differential magnetic cores by a data converting section into digital data, and conducting software integration by a measured data analyzing section based on the data.


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