The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 1990
Filed:
May. 12, 1988
Walter L Beckwith, Jr, Warwick, RI (US);
Brown & Sharpe Manufacturing Company, North Kingstown, RI (US);
Abstract
Methods for determining nonrigid error parameters that result from deflection or deformation of machine elements and correcting scale readings in a coordinate measuring machine. The nonrigid error parameters are a function of probe position along two directions. In a bridge type coordinate measuring machine, the y-direction error parameters are a function of probe position in both x and y directions and thus exhibit nonrigid behavior. Nonrigid error parameters are measured by making error measurements at a plurality of corresponding points along two parallel, spaced-apart measurement lines. The error measurements are substituted into simultaneous equations for the error parameters, and the equations are solved for the coefficients. The coefficients are used to determine the axial errors at any point in the measuring volume. The axial errors are subtracted from the scale readings.