The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 1990

Filed:

Oct. 13, 1988
Applicant:
Inventor:

Louis Destannes, Jarrie, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
338-2 ; 338-5 ;
Abstract

A strain gauge for compensating the creep of a support and a process for obtaining a strain gauge. The gauge is bonded to a support and includes a piezoresistive pattern etched on one face of a flexible film. A layer of a material subject to relaxation is deposited on the other face of the film. The relaxation layer is bonded to a test piece of the same material as the support. A constant force is applied for producing a creep on the test piece and the resistance of gauge as a function of time is measured. The thickness of the relaxation layer is adjusted to cancel out the evolution of the resistance of the gauge.


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