The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 1990

Filed:

Apr. 22, 1988
Applicant:
Inventor:

Yuichi Kadokawa, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 376 ; 371 371 ;
Abstract

An error correcting system for obtaining an error location polynomial from a syndrome or an error pattern from an error location and a syndrome when decoding a long distance code, the error correcting system comprising steps of setting a data word A.sub.(i+j-2) to each element q.sub.i,j of a matrix consisting of p rows and (p+1) columns [where 1.ltoreq.i.ltoreq.p, 1.ltoreq.j.ltoreq.p+1 and A.sub.0 to A.sub.2p-1 denote a syndrome of an error location] performing left hand elementary transformation over the matrix, and obtaining the coefficient of each term of the polynomial.


Find Patent Forward Citations

Kadokawa, Yuichi. (1990). Error correcting system and device (U.S. Patent No. 4937829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4937829

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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