The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 1990
Filed:
Nov. 14, 1988
Richard A Snyder, Chester, NH (US);
Martin J Moynihan, Stoneham, MA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
This invention relates to a method and apparatus for automatically controlling scan line direction in a linear array ultrasonic Doppler scanning system. More particularly, this system determines an ideal scan line angle and point of origin for a given sample volume having fluid flow in a given direction. The system then determines left and right limiting angles for the given sample volume taking into account the geometry of the viewing area relative to the sample volume and the maximum steering angle of the transducers of the transducer array being utilized. Where, because of pulse repetition rate considerations, a maximum depth from the sampling aperture of the linear array to the sample volume exists, this maximum depth is also taken into account in determining the limiting angles. The system then uses the ideal angle as a scan angle is such ideal angle is between the limiting angles and utilizes a selected one of the limiting angles determined in accordance with predetermined criteria, if the ideal angle is outside the limiting angles. Once the scan angle has been determined, this angle may be utilized to identify the aperture to be utilized for the given scan.