The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 1990

Filed:

Mar. 06, 1989
Applicant:
Inventors:

Larry L Carver, Manhattan Beach, CA (US);

Charles E Zamzow, Rancho Palos Verdes, CA (US);

Donald D Mladenoff, Alta Loma, CA (US);

Assignee:

Northrop Corporation, Hawthorne, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36457101 ; 364191 ; 364522 ; 364425 ; 36447424 ;
Abstract

A method of assembling the separate components of a multi-component article includes generating a master definition of the article as a graphic data set in a 3-dimensional graphics computer system including coordinate points precisely locating the design definition in a three dimensional coordinate system. Data sub sets of the master definition are selected for component parts of the article including coordinate points. The data sub sets are transferred to a tool and component parts of the article are formed on the tool utilizing the data sub sets. The formed parts include physical markings thereon corresponding to the coordinate points of the master design definition. The data sub set are further downloaded to a microprocessor controlled measuring device. The measuring device is calibrated to the master design definition utilizing the physical markings on one of the parts. Further of the parts are then located with respect to other of the parts by utilizing their physical markings and referencing these marking back to the master design definition via the microprocessor controlled measuring device.


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