The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 1990
Filed:
May. 06, 1988
Tomoaki Komatsu, Tokyo, JP;
Sigeo Satou, Tokyo, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A method of measuring optical density is characterized by the steps of measuring reflected light from a subject being measured a plurality of times during a predetermined interval, and calculating a mean value of the plurality of measured values. For providing the zero point correction data, the known standard optical densities are previously set in the densitometer. A densitometer for practicing the calibrating method is formed compact and handy and comprises a housing in which measuring elements such as a light projecting member, a light receiving member and a reference light detecting member are incorporated. In the housing are further provided circuits for calculating a density based on outputs from the light receiving and reference light detecting members and for battery power checking. The housing includes a transparent panel formed with a measuring aperture by which a measuring area of a subject is defined.