The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 1990

Filed:

Apr. 17, 1989
Applicant:
Inventors:

Walter J Schrenk, Midland, MI (US);

William E Shrum, St. Louis, MI (US);

John A Wheatley, Midland, MI (US);

Assignee:

The Dow Chemical Company, Midland, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; B32B / ; B32B / ;
U.S. Cl.
CPC ...
428213 ; 428212 ; 428215 ; 4284233 ; 4284235 ; 4284237 ; 4284744 ; 4284752 ; 428480 ; 350163 ; 350164 ;
Abstract

The present invention provides improved elastomeric interference films which are readily coextruded, have improved transparency, and have greater mismatches of refractive indices than those of the prior art. An improved elastomeric optical interference film comprising at least 100 alternating layers of at least first and second divergent substantially transparent elastomeric polymeric materials is provided. Adjacent layers of the first and second polymeric materials differ from each other in refractive index by at least about 0.05, and the thickness of the layers is from about 0.05 to about 0.5 micrometers. Stretching the films results in different wavelengths of light being reflected.


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